ECCN 3B002
NSRSATTest or inspection equipment specially designed for testing or inspecting finished or unfinished semiconductor devices as follows and specially designed components and accessories therefor.
What This ECCN Covers
ECCN 3B002 controls test and inspection equipment specially designed for testing finished or unfinished semiconductor devices — for example equipment for measuring the S-parameters of certain 3A001 microwave devices — plus specially designed components. It is controlled for National Security, Regional Stability, and Anti-Terrorism reasons because semiconductor test capability supports the production of controlled high-performance devices.
Who needs to check this?
Suppliers of semiconductor test and measurement equipment, ATE vendors, and labs testing high-frequency or high-performance devices tied to 3A001.
Compliance tip
Control follows the device the equipment is designed to test — map the tester back to the relevant 3A001 sub-paragraph. The Regional Stability reason ties into advanced-semiconductor policy; verify the Country Chart columns and treat advanced-device test capability with added diligence.
Items Covered
- a.For testing S-parameters of items specified by 3A001.b.3.
- b.For testing microwave integrated circuits controlled by 3A001.b.2.
- c.Inspection equipment designed for "EUV" mask blanks or "EUV" patterned masks.
Control Reasons
Items controlled for national security reasons under multilateral export control regimes.
Items controlled for regional stability reasons.
Items controlled for anti-terrorism reasons. Most items on the CCL have AT controls.
Disclaimer
This information is for reference only. For official classifications, consult BIS or a qualified export control professional.