ECCN 2B006

NSNPAT

Dimensional inspection or measuring systems, equipment, position feedback units and electronic assemblies, as follows .

Category: 2 - Materials ProcessingProduct Group: B - Test EquipmentLast Updated: 2026-04-10

What This ECCN Covers

ECCN 2B006 controls dimensional inspection and measuring systems — computer- or numerically controlled Coordinate Measuring Machines (CMMs), linear and angular displacement measuring instruments, and position-feedback units — that meet specified accuracy thresholds. Precision metrology is controlled because verifying tight tolerances is essential to manufacturing weapons and centrifuge components, giving the entry National Security, Nuclear Nonproliferation, and Anti-Terrorism reasons.

Who needs to check this?

Makers and exporters of CMMs, laser interferometers, optical encoders, and other high-precision measurement and position-feedback equipment.

Compliance tip

Classification depends on stated measurement uncertainty/accuracy over the working range — confirm your system's specification against the entry thresholds, since less accurate instruments may fall outside control. NP controls restrict several license exceptions; verify eligibility in the entry and apply Part 744 end-use diligence.

Reviewed by Jack Tan · Last reviewed: Jun 4, 2026

Items Covered

  • a.Computer controlled or "numerically controlled" Coordinate Measuring Machines (CMM), having a three dimensional length (volumetric) maximum permissible error of length measurement (E0,MPE) at any point within the operating range of the machine (i.e., within the length of axes) equal to or less (better) than (1.7 + L/1,000) µm (L is the measured length in mm) according to ISO 10360-2 (2009);
  • b.Linear displacement measuring instruments or systems, linear position feedback units, and "electronic assemblies", as follows:
  • 1. 'Non-contact type measuring systems' with a 'resolution' equal to or less (better) than 0.2 µm within 0 to 0.2 mm of the 'measuring range';
  • 2. Linear position feedback units specially designed for machine tools and having an overall "accuracy" less (better) than (800 + (600 × L/1,000)) nm (L equals effective length in mm);
  • 3. Measuring systems having all of the following:
  • 3.a. Containing a "laser";
  • 3.b. A 'resolution' over their full scale of 0.200 nm or less (better); and
  • 3.c. Capable of achieving a "measurement uncertainty" equal to or less (better) than (1.6 + L/2,000) nm (L is the measured length in mm) at any point within a measuring range, when compensated for the refractive index of air and measured over a period of 30 seconds at a temperature of 20±0.01 °C;
  • 4. "Electronic assemblies" specially designed to provide feedback capability in systems controlled by 2B006.b.3;
  • c.Rotary position feedback units specially designed for machine tools or angular displacement measuring instruments, having an angular position "accuracy" equal to or less (better) than 0.9 second of arc;
  • d.Equipment for measuring surface roughness (including surface defects), by measuring optical scatter with a sensitivity of 0.5 nm or less (better).

Control Reasons

NSNational Security

Items controlled for national security reasons under multilateral export control regimes.

Column 1: YesColumn 2: No
NPNuclear Nonproliferation

Items controlled for nuclear nonproliferation reasons.

Column 1: YesColumn 2: No
ATAnti-Terrorism

Items controlled for anti-terrorism reasons. Most items on the CCL have AT controls.

Column 1: YesColumn 2: No

Disclaimer

This information is for reference only. For official classifications, consult BIS or a qualified export control professional.

Official Reference